Surface chemical analysis. X-ray photoelectron spectroscopy. Estimating and reporting detection limits for elements in homogeneous materials Ingestion-build-61878 e) specifies the various conditions

e) specifies the various conditions of use of these concepts

and applications that provide control and coordination of air interface operation

reflecting the present state of knowledge

This International Standard is not intended to replace terms and definitions published in documents or user interfaces issued or created by manufacturers

By adopting requirements under PD CEN/TR 13695‑2

Surface chemical analysis. X-ray photoelectron spectroscopy. Estimating and reporting detection limits for elements in homogeneous materials Ingestion-build-61878 e) specifies the various conditions1 Scope This document specifies a procedure by which elemental detection limits in X ray photoelectron spectroscopy (XPS) can be estimated from data for a particular sample in common analytical situations and reported. This document is applicable to homogeneous materials and is not applicable if the depth distribution of elements is inhomogeneous within the information depth of the technique.